The compound microscope is a precision tool for measuring the height (or thickness) of small objects. Unfortunately, it is not common knowledge what equations have to be used to ensure the most accurate measurements. With this paper, I give a short introduction to improving the accuracy of vertical measurements under the compound microscope. The study is based on G. W. White's paper published in 1970 .
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'Height Measurements under the Compound Microscope'
Comments to the author, Gregor Overney, are welcomed.
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